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Industry News, Trends, and Technology, and Standards Updates

European Advanced Process Control and Manufacturing Conference XVII: Retrospective and Invitation

Posted by Alan Weber: Vice President, New Product Innovations on May 17, 2017 11:30:00 AM

APC.jpgCimetrix participated in the recent European Advanced Process Control and Manufacturing (apc|m) Conference, along with over 150 control professionals across the European and global semiconductor manufacturing industry. The conference was held in Dublin, a lively city on the east coast of Ireland which features a charming juxtaposition of old and new and is home to 1.2 million of the friendliest and most talkative people on the planet! 

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Of course, one of Ireland’s greatest “natural resources” may also contribute to their fine spirits…

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This conference, now in its 17th year and organized by Silicon Saxony, is one of only a few global events dedicated to the domain of semiconductor process control and directly supporting technologies. This year’s attendance was up from that of the three previous years, a clear indication that this area continues to hold keen interest for the European high-tech manufacturing community. Moreover, the participants represented all links in the semiconductor manufacturing value chain, from universities and research institutes to component, subsystem, and equipment suppliers to software product and services providers to semiconductor IDMs and foundries across a wide spectrum of device types to industry trade organizations – something for everyone.

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The local sponsor for the conference was Intel, which is the largest private-sector investor in the Irish economy and one of its biggest employers. In addition to excellent logistics support, Intel hosted a lovely evening of fine food and local entertainment at the world-renowned Trinity College.

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As in many prior years, Cimetrix was privileged to present at this conference. Alan Weber delivered a talk entitled “Smarter Manufacturing with SEMI Standards: Practical Approaches for Plug-and-Play Application Integration.” This topic was well aligned with one of the key themes of this year’s event, but stressed the point that our industry already has at its disposal many of the tools, techniques, and enabling standards required for Smart Manufacturing. Specifically, the presentation illustrated how the new SEMI E172 SECS Equipment Data Dictionary (SEDD) standard could be used to document an equipment’s GEM interface in way that provided much of the same hierarchical structure and context information inherent in the latest generation of EDA metadata models (SEMI E120, E125, and E164). If you want to know more, feel free to download a copy of the entire presentation from our web site.

In addition to Smart Manufacturing, recurring themes of the presentations included:

  • The IoT (Internet of Things) and interesting applications for all these “things” (e.g., most new drugs depend on a “smart delivery device” to be used safely and effectively)
  • Decision-driven data collection strategies (vs. “just in case” approaches)
  • Automated analysis, automated decision making, artificial intelligence, and other forms of machine learning
  • The evolution from reactive systems to predictive systems, or in Gartner’s terms, using data to move from hindsight to insight to foresight 
  • The increasing use eOCAP techniques (electronic aids and workflow engine support for Out-of-Control Action Plan execution) 
  • And, last but certainly not least, connectivity standards and technologies as key enablers of much of the above

The agenda also featured keynotes and invited talks from a variety of sources, namely:

  • Bosch – Success Factors for Semiconductor Manufacturing in High-Cost Locations
  • Intel – IoT’s Connected Devices and Big Data Analytics: the Opportunities and Challenges in Semiconductor Manufacturing
  • ST Microelectronics – FDC Control: the Loop Between Standardization and Innovation
  • IBM Research – Automating Analytics for Cognitive IoT 
  • Rudolph Technologies – Smart Manufacturing
  • Applied Materials – Advancements in FDC: Reducing False Alarms and Optimizing Model and Limits Management

The insights gained from these and the other 30+ presentations are too numerous to list here, but in aggregate, they provided an excellent reminder of how relevant semiconductor technology has become for our comfort, sustenance, safety, and overall quality of life. 

This conference and its sister conference in the US are excellent venues to understand what manufacturers do with all the data they collect, so if this topic piques your interest, be sure to put these events on your calendar in the future. In the meantime, if you have questions about any of the above, or want to know how equipment connectivity and control fit into the overall Smart Manufacturing landscape, please contact us!

Topics: Interface A, EDA, European APCM Conference

2013 SYSTEMA Expert Day - Solutions for Semiconductor Manufacturing

Posted by Cimetrix on Apr 2, 2013 9:15:00 AM

by Alan Weber

Director of Value-Added Products

Advanced Software Solutions for Equipment Health and Productivity Monitoring

On April 18, 2013, SYSTEMA GmbH and Cimetrix will host the second SYSTEMA Expert Day 2013 in Dresden, Germany. The focus will be on advanced software solutions for equipment health and productivity monitoring in the discrete manufacturing industries.

SYSTEMA chose the time and place for this event to make it convenient for attending the 2013 European APCM Conference (www.apcm-europe.eu), which will be held at the Dresden Hilton on April 15-17. 

There will be presentations from industry experts across the semiconductor supply chain, including semiconductor manufacturers, equipment suppliers, and software products and services suppliers.

Monitor

The topics will address equipment-related challenges facing semiconductor manufacturers, and there will be discussions and demonstrations regarding:

  • The best practices in data collection
  • Fingerprinting  - equipment  health monitoring and fault diagnosis
  • Wait Time Waste reduction using substrate-level equipment productivity tracking and analysis.

Wait Time Waste Monitor 

The agenda as it is currently:

 Time

 Topic

 Speaker

8:30 – 9:00

 Registration

 

9:00 – 9:15

 Welcome & Introduction

 Ricco Walter, SYSTEMA  GmbH

9:15 – 10:00

 Metadata Standards, Equipment Modeling, and  Conformance Testing

 Alan Weber, Cimetrix

10:00 – 10:30

 From Equipment Signals to Quality Information

 Roland Willmann, acp-IT

10:30 – 11:00

 Break

 

11:00 – 11:30

 Emerging Best Practices in Equipment Professional  Services

 David Grimes, TEL  Europe

11:30 – 12:00

 Identifying Throughput Time Issues –
 Use Cases in  Tool Productivity Monitoring

 Alan Weber, Cimetrix

12:00 – 13:30

 Lunch and Panel Discussion:
 “Future Directions in Equipment Data Analysis"

 Speaker Panel

There may be changes to the agenda, so check the SYSTEMA web page for the event for more details (see the link below).

The people who will get the most out of these presentations and discussions are

  • Equipment and process engineers
  • Field service engineers and system integration specialist
  • Advanced process control specialists
  • Automation technology developers and automation software product managers
For more information, visit the SYSTEMA Expert Day web page at http://bit.ly/YfM07U

Topics: SYSTEMA GmbH, Partners, European APCM Conference

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